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- B.S., 1954, Iowa State University
- Ph.D., 1961, Cornell University
Professor Ohlsen's research involves the study of defects and dopants in crystalline and amorphous semiconducting solids. The microwave techniques of Electron Paramagnetic Resonance (EPR), Optically Detected Magnetic Resonance (ODMR), and Microwave Modulated Photoluminescence (MMPL) are usually employed in these studies. Amorphous silicon, crystalline III-V semiconductors, and chalcogenides have been the subjects of recent investigations.